LUMOS II
Automated infrared microscopy and imaging.
Bruker Optics / Applications
Failure and contamination analysis
Find the chemical differences within a failed part.
Application details.
Small inclusions, deposits and layers can determine the cause of a material failure. Microscopy connects the location of a feature with its chemical spectrum. A useful enquiry describes the part, the suspected problem and the size of the feature.
Tell us about your sample.
Feature size, sample access and a comparison between affected and unaffected material.
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Related instruments.
HYPERION II
A configurable platform for infrared microscopy.
SENTERRA II
Raman microscopy for detailed material analysis.